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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| an_95-1.pdf | an_95-1.pdf | 06/03/20 | Test & Measurement | 1295 kB | 0 | HP | an 95-1 |
| a-138.pdf | a-138.pdf | 03/12/19 | ADVANCES IN MICROWA | 10871 kB | 15 | HP | a-138 |
| 5990-5729EN Phase Noise Measurement Solutions - Selection Guide c20140918 [24].pdf | 5990-5729EN Phase Noise Measurement Solutions - Selection Guide c20140918 [24].pdf | 30/08/20 | Keysight Technologies Phase Noise Measur | 4225 kB | 3 | Agilent | 5990-5729EN Phase Noise Measurement Solutions - Selection Guide c20140918 [24] |
| Techniques for Precise Measurement Calibrations in the Field - Application Note 5991-0421EN c2014072 | Techniques for Precise Measurement Calibrations in the Field - Application Note 5991-0421EN c2014072 | 14/10/21 | Keysight Technologies Techniques for Pre | 866 kB | 5 | Agilent | Techniques for Precise Measurement Calibrations in the Field - Application Note 5991-0421EN c2014072 |
| 5991-0423EN Techniques for Precise Power Measurements in the Field - Application Note c20140722 [21] | 5991-0423EN Techniques for Precise Power Measurements in the Field - Application Note c20140722 [21] | 14/06/21 | Keysight Technologies Techniques for Pre | 2418 kB | 1 | Agilent | 5991-0423EN Techniques for Precise Power Measurements in the Field - Application Note c20140722 [21] |
| 5988-9826EN High Precision Time Domain Reflectometry - Application Note c20141125 [19].pdf | 5988-9826EN High Precision Time Domain Reflectometry - Application Note c20141125 [19].pdf | 29/08/20 | Keysight Technologies High Precision Tim | 9132 kB | 6 | Agilent | 5988-9826EN High Precision Time Domain Reflectometry - Application Note c20141125 [19] |
| XSA_SWRev_History-WinXP X-Series Revision History - Windows XP c20140929 [87].pdf | XSA_SWRev_History-WinXP X-Series Revision History - Windows XP c20140929 [87].pdf | 27/12/19 | Instrument Software Rev | 684 kB | 4 | Agilent | XSA SWRev History-WinXP X-Series Revision History - Windows XP c20140929 [87] |
| 5989-6185EN.pdf | 5989-6185EN.pdf | 09/03/20 | 2795 kB | 0 | HP | 5989-6185EN | |
| 5989-6184EN.pdf | 5989-6184EN.pdf | 14/11/19 | 2004 kB | 2 | HP | 5989-6184EN | |
| 5989-4840EN.pdf | 5989-4840EN.pdf | 22/03/20 | Specifying Calibration Standards and Kit | 3793 kB | 4 | HP | 5989-4840EN |
| Resistance_253B DC Current_253B AC Current_253B and Frequency and Period Measurement Errors in DMMs | Resistance_253B DC Current_253B AC Current_253B and Frequency and Period Measurement Errors in DMMs | 27/05/21 | Resistance; DC Current; AC Current; and | 362 kB | 4 | Agilent | Resistance 253B DC Current 253B AC Current 253B and Frequency and Period Measurement Errors in DMMs |
| an_243-3.pdf | an_243-3.pdf | 06/03/20 | 429 kB | 0 | HP | an 243-3 | |
| 5968-4506E.pdf | 5968-4506E.pdf | 07/09/19 | Agilent PN 4294A New Technologies for Ac | 330 kB | 5 | HP | 5968-4506E |
| 2962_Semiconductor_Manufacturing.pdf | 2962_Semiconductor_Manufacturing.pdf | 22/03/20 | A | 397 kB | 3 | Keithley | 2962 Semiconductor Manufacturing |
| 5951-0065.pdf | 5951-0065.pdf | 19/03/20 | 8553 kB | 3 | HP | 5951-0065 | |
| a-218.pdf | a-218.pdf | 11/03/20 | , , AN ANALYSIS | 1211 kB | 3 | HP | a-218 |
| Techniques for Precise Interference Measurements in the Field - Application Note 5991-0418EN c201407 | Techniques for Precise Interference Measurements in the Field - Application Note 5991-0418EN c201407 | 08/07/21 | Keysight Technologies Techniques for Pre | 795 kB | 1 | Agilent | Techniques for Precise Interference Measurements in the Field - Application Note 5991-0418EN c201407 |
| 5989-4839EN.pdf | 5989-4839EN.pdf | 20/03/20 | Agilent PNA Microwave Network Analyzers | 1527 kB | 0 | HP | 5989-4839EN |
| 5952-1130a.pdf | 5952-1130a.pdf | 09/03/20 | 3171 kB | 1 | HP | 5952-1130a | |
| 5952-8142.pdf | 5952-8142.pdf | 25/11/19 | 795 kB | 4 | HP | 5952-8142 | |